DocumentCode :
122197
Title :
An innovative concentrator system based on Cu(In,Ga)Se2 microcells
Author :
Paire, Myriam ; Lombez, Laurent ; Collin, S. ; Pelouard, Jean-Luc ; Lincot, Daniel ; Guillemoles, Jean-Francois
Author_Institution :
R&D, Inst. for R&D on Photovoltaic Energy (IRDEP), EDF, Chatou, France
fYear :
2014
fDate :
8-13 June 2014
Firstpage :
2930
Lastpage :
2933
Abstract :
In this work we look at a new type of concentrator photovoltaic material, Cu(In,Ga)Se2. Cu(In,Ga)Se2 solar cells are polycrystalline thin film devices, that can be deposited by a variety of techniques. A few concentrating experiments were carried out[1]-[3], but limited to low concentrations to avoid excessive heating of these cells grown on glass substrate, and spreading losses in the ZnO:Al window layer (10 - 40 ohm/sq). We proposed to use a microcell architecture [4], [5], with lateral dimension varying from a few μm to hundreds of μm, to overcome these limitations. We show here that Cu(In,Ga)Se2 devices can work well without detrimental signals from the edges up to very small sizes (10-5 cm2). The lower crystallographic quality of the Cu(In,Ga)Se2 cells may well be in fact an advantage to go micrometric devices A 5% absolute efficiency increase on Cu(In,Ga)Se2 microcells at 475 suns is observed. Voc increases up to several thousand suns, temperature increment stays under 20°C at 1000 suns. Features of the high illumination regime are highlighted and modeled.
Keywords :
aluminium; copper compounds; glass; solar cells; thin film devices; zinc compounds; Cu(Ga)Se2; Cu(In)Se2; ZnO:Al; concentrator photovoltaic material; crystallographic quality; glass substrate; lateral dimension; microcell architecture; micrometric devices; polycrystalline thin film devices; solar cells; window layer; Chemicals; Indexes; Photovoltaic cells; Cu(In,Ga)Se2; Current-voltage characteristics; coévaporation; electrodeposition; inhomogeneities; photovoltaic cells;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location :
Denver, CO
Type :
conf
DOI :
10.1109/PVSC.2014.6925545
Filename :
6925545
Link To Document :
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