DocumentCode
122200
Title
A simple approach for the simulations in the mechanical studies of drilled wafers
Author
Barredo, Josu ; Fraile, Alberto ; Alarcon, Covadonga ; Hermanns, Lutz
Author_Institution
Center for Modeling in Mech. Eng. (CEMIM-F2I2), Madrid, Spain
fYear
2014
fDate
8-13 June 2014
Firstpage
2941
Lastpage
2946
Abstract
The mechanical strength of drilled wafers, according to a EWT or MWT structure, is widely influenced by the presence of holes. In the study of the strength of these samples, the holes should be included in the simulations resulting in very heavy models with high calculation times. The traditional mechanical design for ductile materials with holes is based in the application of stress concentration factors. This method is not valid in this case due to the strength dependence on the size of the loaded area. In this paper, a stress concentration surface is proposed getting a much simpler approach for the simulations with drilled samples.
Keywords
ductility; solar cells; stress analysis; EWT structure; MWT structure; drilled wafers; ductile materials; emitter wrap-through; mechanical design; metal wrap-through; solar cells; stress concentration factors; stress concentration surface; Iron; Load modeling; Photovoltaic cells; Semiconductor device modeling; Silicon; Stress; EWT solar cells; Finite Element Method; Ring-on-Ring test; Weibull statistic; mono-crystalline silicon; stress concentration;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location
Denver, CO
Type
conf
DOI
10.1109/PVSC.2014.6925548
Filename
6925548
Link To Document