Title :
Scanning electron microscopy analysis of defect clusters in multicrystalline solar grade silicon solar cells
Author :
Berthod, Charly ; Odden, Jan Ove ; Saetre, Tor Oskar
Author_Institution :
Univ. of Agder, Grimstad, Norway
Abstract :
Solar cells from an identical commercial manufacturing unit have been investigated by electroluminescence to first detect the defect clusters. A further analysis has been done by scanning electron microscopy in secondary electron imaging mode to understand the propagation mechanism of defects. It appears that defect cluster boundaries can be very sharp or spread in the bulk with little apparent effect on the overall cell efficiency. And it is shown that grain boundaries act clearly as arrests to further propagation of these defects.
Keywords :
electroluminescence; elemental semiconductors; grain boundaries; scanning electron microscopy; silicon; solar cells; Si; defect clusters; electroluminescence; grain boundaries; multicrystalline solar grade silicon solar cells; scanning electron microscopy; secondary electron imaging mode; Acceleration; Electroluminescence; Grain boundaries; Photovoltaic cells; Scanning electron microscopy; Silicon; charge carrier lifetime; electroluminescence; photovoltaic cells; scanning electron microscopy; silicon;
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location :
Denver, CO
DOI :
10.1109/PVSC.2014.6925549
