• DocumentCode
    122210
  • Title

    High-throughput Si foil technologies at Fraunhofer ISE

  • Author

    Janz, Siegfried ; Driessen, Marion ; Milenkovic, Nena ; Keller, Matthias ; Gust, Elke ; Reber, Stefan

  • Author_Institution
    Fraunhofer Inst. for Solar Energy Syst. ISE, Freiburg, Germany
  • fYear
    2014
  • fDate
    8-13 June 2014
  • Firstpage
    2983
  • Lastpage
    2985
  • Abstract
    Cost reduction is still the driving force in photovoltaic industry. One promising way to tackle this issue in the crystalline silicon technology is to reduce the consumption of highly purified Si raw materials. To avoid kerf losses and to manufacture still high quality Si foils with thicknesses in the range of 50 μm the porous Si approach [1, 2] is one potential solution. Several investigations could show that although Si is an indirect semiconductor such thin layers are sufficient for conversion efficiencies well above 20 % [3] given good material quality and optical confinement. At Fraunhofer ISE we have been working on high-throughput solutions for all necessary technologies such as porosification, reorganization plus Si epitaxy and lift-off. In this paper we will present the first reliable process to produce Si foils with reorganization and epitaxial thickening done in an industrially relevant inline tool. The paper will furthermore give a status report on the different technology steps.
  • Keywords
    crystallisation; elemental semiconductors; epitaxial growth; passivation; silicon; solar cells; Si; cost reduction; crystalline silicon technology; epitaxial thickening; high throughput foil technologies; indirect semiconductor; material quality; optical confinement; photovoltaic industry; Epitaxial growth; Epitaxial layers; Photovoltaic cells; Photovoltaic systems; Reliability; Silicon; crystalline Si; inline epitaxy; lift-off; porosification; reorganization; thin-film;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
  • Conference_Location
    Denver, CO
  • Type

    conf

  • DOI
    10.1109/PVSC.2014.6925558
  • Filename
    6925558