• DocumentCode
    122258
  • Title

    EL inspection of thin-film PV modules in between field operation

  • Author

    Bokalic, Matevz ; Brecl, Kristijan ; Topic, Marko

  • Author_Institution
    Fac. of Electr. Eng., Univ. of Ljubljana, Ljubljana, Slovenia
  • fYear
    2014
  • fDate
    8-13 June 2014
  • Firstpage
    3167
  • Lastpage
    3170
  • Abstract
    Homogeneity and stability of thin-film photovoltaic modules are of key importance for their long life-time and successful competition with other photovoltaic technologies. We have exposed and tracked three commercially available thin-film modules in outdoor conditions during the first months of operation. Before the start and periodically in-between the outdoor operation in maximum power point condition electroluminescence (EL) inspection and standard test condition (STC) performance data were measured. While the initial efficiency of thin-film silicon (both amorphous as well as micromorph tandem) PV modules decreased (-12% and -7%, respectively), the CIGS PV module´s STC conversion efficiency improved (+13%) during the period of the first 144 kWh/m2 of solar irradiation. Much larger changes of EL intensity compared to the initial STC efficiency decrease have been observed in both thin-film silicon and CIGS PV modules indicating much higher sensitivity of EL to the temporal changes during operation.
  • Keywords
    copper compounds; electroluminescence; gallium compounds; indium compounds; inspection; selenium compounds; semiconductor thin films; solar cells; ternary semiconductors; CIGS PV module; CuInGaSe; EL inspection; EL sensitivity; STC conversion efficiency; field operation; inspection; maximum power point condition electroluminescence; micromorph tandem; photovoltaic technologies; solar irradiation; standard test condition; thin-film PV modules; thin-film photovoltaic modules homogeneity; thin-film photovoltaic modules stability; thin-film silicon; Area measurement; Databases; Nonhomogeneous media; Radiation effects; Sealing materials; Silicon; Temperature sensors; electroluminescence; photovoltaics (PV); standard test conditions; thin-film PV modules;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
  • Conference_Location
    Denver, CO
  • Type

    conf

  • DOI
    10.1109/PVSC.2014.6925607
  • Filename
    6925607