DocumentCode :
122258
Title :
EL inspection of thin-film PV modules in between field operation
Author :
Bokalic, Matevz ; Brecl, Kristijan ; Topic, Marko
Author_Institution :
Fac. of Electr. Eng., Univ. of Ljubljana, Ljubljana, Slovenia
fYear :
2014
fDate :
8-13 June 2014
Firstpage :
3167
Lastpage :
3170
Abstract :
Homogeneity and stability of thin-film photovoltaic modules are of key importance for their long life-time and successful competition with other photovoltaic technologies. We have exposed and tracked three commercially available thin-film modules in outdoor conditions during the first months of operation. Before the start and periodically in-between the outdoor operation in maximum power point condition electroluminescence (EL) inspection and standard test condition (STC) performance data were measured. While the initial efficiency of thin-film silicon (both amorphous as well as micromorph tandem) PV modules decreased (-12% and -7%, respectively), the CIGS PV module´s STC conversion efficiency improved (+13%) during the period of the first 144 kWh/m2 of solar irradiation. Much larger changes of EL intensity compared to the initial STC efficiency decrease have been observed in both thin-film silicon and CIGS PV modules indicating much higher sensitivity of EL to the temporal changes during operation.
Keywords :
copper compounds; electroluminescence; gallium compounds; indium compounds; inspection; selenium compounds; semiconductor thin films; solar cells; ternary semiconductors; CIGS PV module; CuInGaSe; EL inspection; EL sensitivity; STC conversion efficiency; field operation; inspection; maximum power point condition electroluminescence; micromorph tandem; photovoltaic technologies; solar irradiation; standard test condition; thin-film PV modules; thin-film photovoltaic modules homogeneity; thin-film photovoltaic modules stability; thin-film silicon; Area measurement; Databases; Nonhomogeneous media; Radiation effects; Sealing materials; Silicon; Temperature sensors; electroluminescence; photovoltaics (PV); standard test conditions; thin-film PV modules;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location :
Denver, CO
Type :
conf
DOI :
10.1109/PVSC.2014.6925607
Filename :
6925607
Link To Document :
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