Title :
Outdoor exposure tests of silicon crystalline photovoltaic for reliability
Author :
Hyun-A Kim ; Jung-Jin Choi ; Sang-Cheol Kim
Author_Institution :
Korea Conformity Labs., Seoul, South Korea
Abstract :
The photovoltaic (PV) system is one of the renewable energies that attract the attention of researchers in the recent decades. The evaluation of the PV performance requires the measurement of the current as a function of irradiance, temperature, humidity, wind power and wind direction. This work presents a degradation factor of silicon crystalline photovoltaics based on maximum yield power generation tracking system in outdoor exposure. Outdoor exposure tests of silicon crystalline PV have been conducted in Seosan-si, Chungcheongnam-do, Republic of Korea.
Keywords :
elemental semiconductors; integrated circuit reliability; integrated circuit testing; photovoltaic power systems; silicon; solar cells; PV system; maximum yield power generation tracking system; outdoor exposure; outdoor exposure tests; photovoltaic system; reliability; renewable energies; silicon crystalline photovoltaic degradation factor; wind direction; wind power; Atmospheric measurements; Companies; Indexes; Moisture measurement; Power measurement; Temperature measurement; Wind power generation; Silicon crystalline photovoltaic; degradation; failure modes; field experience; maximum yield power generation tracking system; outdoor test; photovoltaic; reliability;
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location :
Denver, CO
DOI :
10.1109/PVSC.2014.6925614
