Title :
Analysis of light propagation in thin-film solar cells by dual-probe scanning near-field optical microscopy
Author :
Lehnen, Stephan ; Paetzold, Ulrich W. ; Ermes, Markus ; Bittkau, Karsten ; Carius, Reinhard
Author_Institution :
IEK5 - Photovoltaics, Forschungszentrum Julich GmbH, Julich, Germany
Abstract :
In this study, light propagation in textured hydrogenated microcrystalline silicon (μc-Si:H) thin-film solar cells is investigated on a sub-micron-scale by means of dual-probe scanning near-field optical microscopy (SNOM). Applying advanced modes of operation - exclusively available at dual probe SNOMs - light propagation is analyzed with subwavelength resolution. Measurements at μc-Si:H thin-film solar cells layer are presented visualizing the influence of local surface features on light propagation. Furthermore, the intensity decay of light guided inside the solar cell is mapped. The observed intensity decay agrees well with theory, verifying the validity of the method.
Keywords :
elemental semiconductors; hydrogen; light propagation; near-field scanning optical microscopy; silicon; solar cells; thin film devices; SNOM; Si:H; dual-probe scanning near-field optical microscopy; intensity decay; light propagation; local surface features; submicron-scale; subwavelength resolution; textured hydrogenated microcrystalline thin-film solar cells; Absorption; Lighting; Microscopy; Photovoltaic cells; Probes; Silicon; Wavelength measurement; characterization; light-trapping; near-field microscopy; thin-films;
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location :
Denver, CO
DOI :
10.1109/PVSC.2014.6925652
