Title :
Error analysis of multiple-output combinational circuits in a noisy environment
Author :
Cheng, D.K. ; Shankar, A.U.
Author_Institution :
Syracuse University, Electrical & Computer Engineering Department, Syracuse, USA
fDate :
8/1/1979 12:00:00 AM
Abstract :
The output behaviour of multiple-output combinational circuits in response to stochastic inputs is examined with the help of Walsh functions. The joint error probabilities at the output can be determined from the input statistics by jointly considering two inputs: a noise-free signal and the same signal corrupted by independent additive noise. For the case of signal and noise components which are independent and each identically distributed, the joint error probabilities are polynomials in the expected values of signal and noise. Interesting and relevant special situations are examined, and an example is given.
Keywords :
Walsh functions; combinatorial circuits; error analysis; logic testing; independent additive noise; multiple output combinatorial circuit;
Journal_Title :
Computers and Digital Techniques, IEE Journal on
DOI :
10.1049/ij-cdt.1979.0029