DocumentCode
122309
Title
Recommendations for CSM and Riso ground fault detector trip thresholds
Author
Flicker, Jack ; Johnson, Jamie ; Albers, Mark ; Ball, Greg
Author_Institution
Sandia Nat. Labs., Albuquerque, NM, USA
fYear
2014
fDate
8-13 June 2014
Firstpage
3391
Lastpage
3397
Abstract
PV ground faults have caused many fires in the U.S. and around the world. One cause of these fires is a “blind spot” in the ground fault ground fault fuse. As a result of this discovery, the Solar America Board for Codes and Standards identified a number of alternatives to ground fault fuses, but these technologies have limited historical use in the United States. This paper investigates the efficacy of two of these devices, isolation resistance monitoring (Riso) and current sense monitoring (CSM), in small (~3 kW) and large (>500 kW) arrays using both simulation and field data. The field data includes Riso and leakage current measurements of multiple PV systems, while the simulations include Riso and CSM measurements from various ground faults. From these results, it was found that the majority of leakage current is not from the modules, but from low inverter isolation-to-ground. Therefore appropriate thresholds to maximize detection area while minimizing nuisance tripping should be made based on the specific inverter isolation and switching noise rather than the configuration of the PV system.
Keywords
electric fuses; invertors; leakage currents; photovoltaic power systems; power generation faults; CSM; PV ground faults; PV system; Riso ground fault detector trip thresholds; Solar America Board for Codes and Standards; current sense monitoring; ground fault ground fault fuse.; inverter isolation-to-ground; isolation resistance monitoring; nuisance tripping; switching noise; Current measurement; Electrical resistance measurement; Fuses; IEC standards; Inverters; Resistance; Voltage measurement; Riso ; RCD; SPICE; ground faults;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location
Denver, CO
Type
conf
DOI
10.1109/PVSC.2014.6925659
Filename
6925659
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