DocumentCode :
1223110
Title :
Spiral silicon drift detectors
Author :
Rehak, P. ; Gatti, E. ; Longoni, A. ; Sampietro, M. ; Holl, P. ; Lutz, G. ; Kemmer, J. ; Prechtel, U. ; Ziemann, T.
Author_Institution :
Brookhaven Nat. Lab., Upton, NY, USA
Volume :
36
Issue :
1
fYear :
1989
fDate :
2/1/1989 12:00:00 AM
Firstpage :
203
Lastpage :
209
Abstract :
An advanced large-area silicon photodiode and X-ray detector, called the spiral drift detector, was designed, produced, and tested. The detector has a very small capacitance of about 0.1 pF and a leakage current under 1 nA at room temperature. All electrons generated at the silicon-silicon oxide interface are collected on a guard rather than contributing to the detector leakage current. The decrease of the leakage current reduces the parallel noise of the detector. This decrease and the very small capacitance of the detector anode with a capacitively matched preamplifier may improve the energy resolution of spiral drift detectors operating at room temperature to about 50 electrons RMS. This resolution is in the range attainable at present only by cooled semiconductor detectors
Keywords :
X-ray detection and measurement; elemental semiconductors; photodiodes; semiconductor counters; silicon; 0.1 pF; 1 nA; Si-SiO2; X-ray detector; capacitively matched preamplifier; energy resolution; large area Si photodetector; leakage current; parallel noise; semiconductor counter; spiral drift detector; Capacitance; Electrons; Energy resolution; Leak detection; Leakage current; Photodiodes; Silicon; Spirals; Temperature; X-ray detectors;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.34435
Filename :
34435
Link To Document :
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