DocumentCode
1223444
Title
Time-Resolved Spatial Profile Measurements of the Ion Temperature on JET
Author
Brocken, H.J.B.M. ; van der Ven, H.W.
Volume
9
Issue
3
fYear
1981
Firstpage
92
Lastpage
96
Abstract
A new diagnostic instrumental method based on the scattering of the neutral particles of a high-energetic probing beam is proposed for the continuous measurements of the ion temperature and density profiles of the JET plasma. A compact multichannel energy analyzer using the time-of-flight (TOF) method is introduced as an appropriate analyzing technique.
Keywords
Density measurement; Instruments; Particle beam measurements; Particle beams; Particle measurements; Particle scattering; Plasma density; Plasma diagnostics; Plasma measurements; Plasma temperature;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/TPS.1981.4317402
Filename
4317402
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