DocumentCode :
1223458
Title :
Design and performance of tunnel collector HBTs for microwave power amplifiers
Author :
Welty, Rebecca J. ; Mochizuki, Kazuhiro ; Lutz, Charles R. ; Welser, Roger E. ; Asbeck, Peter M.
Author_Institution :
Lawrence Livermore Nat. Lab., CA, USA
Volume :
50
Issue :
4
fYear :
2003
fDate :
4/1/2003 12:00:00 AM
Firstpage :
894
Lastpage :
900
Abstract :
AlGaAs/GaAs/GaAs and GaInP/GaAs/GaAs n-p-n heterojunction bipolar transistors (HBTs) are now in widespread use in microwave power amplifiers. In this paper, improved HBT structures are presented to address issues currently problematic for these devices: high offset and knee voltages and saturation charge storage. Reduced HBT offset and knee voltages (VCE,os and Vk) are important to improve the power amplifier efficiency. Reduced saturation charge storage is desirable to increase gain under conditions when the transistor saturates (such as in over-driven Class AB amplifiers and switching mode amplifiers). It is shown in this paper that HBT structures using a 100-Å-thick layer of GaInP between the GaAs base, and collector layers are effective in reducing VCE,os to 30 mV and Vk measured at a collector current density of 2×104 A/cm2 to 0.3 V (while for conventional HBTs VCE,os=0.2 V and Vk=0.5 V are typical). A five-fold reduction in saturation charge storage is simultaneously obtained.
Keywords :
current density; heterojunction bipolar transistors; microwave bipolar transistors; tunnel transistors; 0.3 V; 100 Å; 30 mV; AlGaAs-GaAs-GaAs; AlGaAs/GaAs/GaAs; GaInP-GaAs-GaAs; GaInP/GaAs/GaAs; collector current density; heterojunction bipolar transistors; knee voltages; microwave power amplifiers; offset voltages; power amplifier efficiency; saturation charge storage; tunnel collector HBTs; Current measurement; Density measurement; Gain measurement; Gallium arsenide; Heterojunction bipolar transistors; Knee; Microwave amplifiers; Microwave devices; Power amplifiers; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2003.812088
Filename :
1206868
Link To Document :
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