DocumentCode :
1223563
Title :
On the Representation and Measurement of Waveguide Discontinuities
Author :
Marcuvitz, Nathan
Author_Institution :
Polytechnic Institute of Brooklyn, Brooklyn, N.Y.
Volume :
36
Issue :
6
fYear :
1948
fDate :
6/1/1948 12:00:00 AM
Firstpage :
728
Lastpage :
735
Abstract :
The principal aims of this paper are twofold: (1) to discuss and interrelate the various equivalent circuit representations of a general 2N-terminal waveguide structure that are obtained on different choices of terminal planes; and (2) to describe a precision method for measuring the circuit parameters of such structures. Basic to both of these considerations is a tangent relation introduced by Weissfloch to describe and measure the input-output behavior of a four-terminal waveguide structure.
Keywords :
Circuits; Electromagnetic analysis; Electromagnetic measurements; Electromagnetic scattering; Electromagnetic waveguides; Impedance; Magnetic field measurement; Voltage; Waveguide discontinuities; Waveguide theory;
fLanguage :
English
Journal_Title :
Proceedings of the IRE
Publisher :
ieee
ISSN :
0096-8390
Type :
jour
DOI :
10.1109/JRPROC.1948.230278
Filename :
1697719
Link To Document :
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