• DocumentCode
    1223613
  • Title

    Studies of the LBL CMOS integrated amplifier/discriminator for randomly timed inputs from fixed target experiments

  • Author

    Russ, J.S. ; Yarema, R.J. ; Zimmerman, T.

  • Author_Institution
    Carnegie-Mellon Univ., Pittsburgh, PA, USA
  • Volume
    36
  • Issue
    1
  • fYear
    1989
  • fDate
    2/1/1989 12:00:00 AM
  • Firstpage
    477
  • Lastpage
    481
  • Abstract
    A group at Lawrence Berkeley Laboratory (LBL) has reported an elegant CMOS VLSI circuit for amplifying, discriminating, and encoding the signals from highly segmented charge-output devices, e.g. silicon strip detectors or pad readout structures in gaseous detectors. The design exploits switched-capacitor circuits and the well-known time structure of data acquisition in colliding-beam accelerators to cancel leakage effects and switching noise. For random inputs, these methods are not directly applicable. However, the high speed of the reset switches makes possible a mode of operation for fixed target experiments that uses fast resets to erase unwanted data from random triggers. Data acquisition in this mode has been performed. Details of operation and measurements of noise and rate capability are presented
  • Keywords
    CMOS integrated circuits; VLSI; amplifiers; data acquisition; discriminators; ionisation chambers; nuclear electronics; position sensitive particle detectors; semiconductor counters; CMOS VLSI circuit; LBL CMOS integrated amplifier/discriminator; Si; colliding-beam accelerators; data acquisition; gaseous detectors; highly segmented charge-output devices; leakage effects; noise; pad readout structures; random triggers; rate capability; reset switches; strip detectors; switched-capacitor circuits; switching noise; Colliding beam accelerators; Data acquisition; Detectors; Encoding; Laboratories; Silicon; Strips; Switched capacitor circuits; Switching circuits; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.34486
  • Filename
    34486