A system for one- and two-dimensional signal processing for X-ray scattering, tunneling-and atomic force microscopy applications

Author

Halling, H. ; Moeller, R. ; Schummers, A.

Author_Institution

Central Lab. for Electron., KFA Julich GmbH, West Germany

Volume

36

Issue

1

fYear

1989

fDate

2/1/1989 12:00:00 AM

Firstpage

634

Lastpage

637

Abstract

A system has been implemented for the acquisition, processing and display of one- and two-dimensional signals. The hardware is based on an advanced signal processor with integrated floating point circuitry which has been interfaced to IBM PC/XT, AT and Microchannel as well as VME and Multibus II buses. The application software has been written in Turbo Pascal under MS-DOS and is also operational on VME and Multibus II systems. The man/machine interface is menu driven and fast graphics is supported by the signal processor. The system is presently applied for X-ray small angle scattering, tunneling- and atomic force microscopy where the users require fast interactive image processing with high accuracy. Further applications, including microtomography are under consideration

Keywords

IBM computers; X-ray scattering; atomic force microscopy; computerised picture processing; data acquisition; physics computing; Turbo Pascal; X-ray small angle scattering; atomic force microscopy; fast interactive image processing; integrated floating point circuitry; microtomography; signal processor; Application software; Atomic force microscopy; Circuits; Graphics; Hardware; Microchannel; Signal processing; Two dimensional displays; X-ray imaging; X-ray scattering;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.34515

Filename

34515