Title :
A system for one- and two-dimensional signal processing for X-ray scattering, tunneling-and atomic force microscopy applications
Author :
Halling, H. ; Moeller, R. ; Schummers, A.
Author_Institution :
Central Lab. for Electron., KFA Julich GmbH, West Germany
fDate :
2/1/1989 12:00:00 AM
Abstract :
A system has been implemented for the acquisition, processing and display of one- and two-dimensional signals. The hardware is based on an advanced signal processor with integrated floating point circuitry which has been interfaced to IBM PC/XT, AT and Microchannel as well as VME and Multibus II buses. The application software has been written in Turbo Pascal under MS-DOS and is also operational on VME and Multibus II systems. The man/machine interface is menu driven and fast graphics is supported by the signal processor. The system is presently applied for X-ray small angle scattering, tunneling- and atomic force microscopy where the users require fast interactive image processing with high accuracy. Further applications, including microtomography are under consideration
Keywords :
IBM computers; X-ray scattering; atomic force microscopy; computerised picture processing; data acquisition; physics computing; Turbo Pascal; X-ray small angle scattering; atomic force microscopy; fast interactive image processing; integrated floating point circuitry; microtomography; signal processor; Application software; Atomic force microscopy; Circuits; Graphics; Hardware; Microchannel; Signal processing; Two dimensional displays; X-ray imaging; X-ray scattering;
Journal_Title :
Nuclear Science, IEEE Transactions on