DocumentCode :
1223948
Title :
A fast integrating eight-bit bilinear ADC
Author :
Biery, K.A. ; Quimette, D.A. ; Ritchie, J.L.
Author_Institution :
Dept. of Phys., Stanford Univ., CA, USA
Volume :
36
Issue :
1
fYear :
1989
fDate :
2/1/1989 12:00:00 AM
Firstpage :
650
Lastpage :
652
Abstract :
A fast gated charge integrating ADC has been developed for measuring short photomultiplier pulses at very high event rates. The circuit is bilinear with 100 pC full scale and a least count of 150 fC. It features DC coupling, a minimum gate width of 20 ns, a minimum time between events of 200 ns plus gate width, a two event buffer and front-end zero suppression with 100 ns read time per hit channel. Five hundred channels have been built and installed in the rare K L0 decay experiment E791 at Brookhaven National Laboratory
Keywords :
analogue-digital conversion; nuclear electronics; physics computing; scintillation counters; 100 ns; 20 ns; 200 ns; 8 bit; E791; fast gated charge integrating ADC; front-end zero suppression; gate width; short photomultiplier pulses; two event buffer; Coupling circuits; Dynamic range; Event detection; Laboratories; Linear accelerators; Photomultipliers; Physics; Radiation detectors; Scintillation counters; Signal detection;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.34519
Filename :
34519
Link To Document :
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