Title :
An ultra high throughput ADC
Author :
Morita, Mitsukazu ; Takahata, Chuzo ; Saito, Masaki
Author_Institution :
Seiko EG&G Co. Ltd., Tokyo, Japan
fDate :
2/1/1989 12:00:00 AM
Abstract :
An ultrahigh throughput ADC for use with high resolution photon detectors has been developed. The ADC has 13 bit resolution with less than 0.7% differential non-linearity. A 12 bit, commercially available, hybrid ADC circuit has been used with a two step conversion technique. Improved version of the Gatti slider technique is also used to improve the differential non-linearity. Conversion time of 2 microsecond is achieved
Keywords :
analogue-digital conversion; gamma-ray detection and measurement; nuclear electronics; hybrid ADC circuit; photon detectors; slider technique; two step conversion technique; ultrahigh throughput ADC; Buffer storage; Circuits; Error correction; Gamma ray detection; Gamma ray detectors; Linearity; Spectroscopy; Switches; Throughput; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
