• DocumentCode
    1224513
  • Title

    The Effects of Self-Noise on Error Voltage of the Delay-Lock Discriminator

  • Author

    Boyarsky, Abraham ; Fukada, Minoru

  • Author_Institution
    McGill University,Montreal,Que.,Canada
  • Volume
    18
  • Issue
    4
  • fYear
    1970
  • fDate
    8/1/1970 12:00:00 AM
  • Firstpage
    443
  • Lastpage
    447
  • Abstract
    This paper deals with the effects of the correlation self-noise on the error voltage of a radio frequency (RF) delaylock discriminator. The error voltage at the output of the envelope correlation network is determined in terms of the spectral components of the maximal-length sequence and the frequency response of the bandpass filters used in the two channels of the correlation network. The slope of the error voltage in the lock-on state, which is readily obtained from the above analysis, is a quantity of particular interest, because the mean-square tracking error is inversely proportional to the square of the slope. The problem of the mismatch in the two channels of the correlation network is also considered.
  • Keywords
    Band pass filters; Bandwidth; Communications technology; Correlation; Delay effects; Narrowband; Radar tracking; Radio frequency; Signal analysis; Voltage;
  • fLanguage
    English
  • Journal_Title
    Communication Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9332
  • Type

    jour

  • DOI
    10.1109/TCOM.1970.1090373
  • Filename
    1090373