Title :
Electromechanical Properties of Bismuth Silicon Oxide (Bi12SiO20)
Author :
Schweppe, H. ; Quadflieg, P.
Keywords :
Acoustic propagation; Bismuth; Crystals; Dielectric constant; Dielectric measurements; Polarization; Pulse measurements; Silicon; Velocity measurement; Vibration measurement;
Journal_Title :
Sonics and Ultrasonics, IEEE Transactions on
DOI :
10.1109/T-SU.1974.29792
