DocumentCode :
1225176
Title :
A Comparative Study on Excess-Loop-Delay Compensation Techniques for Continuous-Time Sigma–Delta Modulators
Author :
Keller, Matthias ; Buhmann, Alexander ; Sauerbrey, Jens ; Ortmanns, Maurits ; Manoli, Yiannos
Author_Institution :
Univ. of Freiburg, Freiburg
Volume :
55
Issue :
11
fYear :
2008
Firstpage :
3480
Lastpage :
3487
Abstract :
Excess loop delay (ELD) is well known for its detrimental effect on the performance and stability of continuous-time sigma-delta modulators. A detailed analysis on the most recently published compensation techniques for single-stage modulators is performed in this paper, thus enabling their application to an arbitrary modulator. Based on different characteristics such as circuit complexity, achievable dynamic range, or requirements on the operational amplifiers, their advantages and disadvantages are investigated. Subsequently, the analysis is extended to cascaded modulators. Contrary to intuition, the results indicate that a compensation of ELD in every stage of the cascade is insufficient for optimal performance. Although not configured in a feedback configuration and as such not suffering from stability problems, each coupling network between two stages must additionally be compensated for ELD.
Keywords :
circuit stability; continuous time systems; coupled circuits; delay circuits; feedback; operational amplifiers; sigma-delta modulation; analog-digital conversion; cascaded modulators; circuit complexity; continuous-time sigma-delta modulator; excess-loop-delay compensation technique; feedback configuration; multistage noise shaping; operational amplifiers; single-stage modulator; stability problems; Analog–digital (A/D) conversion; Analog-digital (A/D) conversion; ELD; MASH; cascaded; continuous time; continuous time (CT); excess loop delay; excess loop delay (ELD); multi-stage nose shaping (MASH); sigma–delta $(SigmaDelta)$; sigma-delta;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2008.925362
Filename :
4526189
Link To Document :
بازگشت