DocumentCode :
1225495
Title :
Process-Invariant Current Source Design: Methodology and Examples
Author :
Pappu, Anand M. ; Zhang, Xuan ; Harrison, Andre V. ; Apsel, Alyssa B.
Author_Institution :
Cornell Univ., Ithaca
Volume :
42
Issue :
10
fYear :
2007
Firstpage :
2293
Lastpage :
2302
Abstract :
In this paper, we present a design methodology and resulting circuits that compensate for process variations without the need for post-fabrication efforts. We demonstrate how, using this methodology, current sources have been designed with more than a factor of two reduction in normalized standard deviation over equivalent uncompensated current sources. To the best of our knowledge, these are the first measured results showing effective circuit design techniques that reduce the impact of process variations by such magnitude. Such circuits can be an effective way to improve circuit yield as process variations increase.
Keywords :
constant current sources; integrated circuit design; integrated circuit yield; current source design; equivalent uncompensated current sources; integrated circuit design; integrated circuit yield; normalized standard deviation; post-fabrication efforts; process variations; CMOS technology; Circuit synthesis; Design methodology; Energy consumption; Feedback circuits; Frequency; Histograms; Process design; Robustness; Voltage-controlled oscillators; Analog design; circuit design techniques; constant current source; deep-submicron circuits; process variations;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2007.905240
Filename :
4317709
Link To Document :
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