DocumentCode :
1225530
Title :
A GaN HEMT Class F Amplifier at 2 GHz With >  80% PAE
Author :
Schmelzer, David ; Long, Stephen I.
Author_Institution :
California Univ., Santa Barbara
Volume :
42
Issue :
10
fYear :
2007
Firstpage :
2130
Lastpage :
2136
Abstract :
A Class F amplifier has been designed, fabricated, and tested using a GaN HEMT transistor and hybrid printed circuit board (PCB) packaging. The amplifier has a peak power-added efficiency (PAE) of 85% with an output power of 16.5 W. A gate-connected field-plated and a source-connected field-plated device of the same size and layout were measured in this topology. An output power and drain efficiency tradeoff, dependant on the drain impedance at the fundamental frequency due to the on-state resistance, is explored. A comparison between Class F and Inverse F, given particular operating conditions for this device, is made.
Keywords :
amplifiers; high electron mobility transistors; printed circuits; wide band gap semiconductors; GaN - Interface; GaN HEMT transistor; HEMT class F amplifier; hybrid printed circuit board; peak power-added efficiency; power 16.5 W; Circuit testing; Electrical resistance measurement; Gallium nitride; HEMTs; Packaging; Power amplifiers; Power generation; Power measurement; Printed circuits; Size measurement; Class F; GaN HEMT; field plate; inverse F;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2007.904317
Filename :
4317712
Link To Document :
بازگشت