• DocumentCode
    1225540
  • Title

    Design and Test of a 175-Mb/s, Rate-1/2 (128,3,6) Low-Density Parity-Check Convolutional Code Encoder and Decoder

  • Author

    Swamy, Rajashekara ; Bates, S. ; Brandon, T.L. ; Cockburn, Bruce F. ; Elliott, Duncan G. ; Koob, J.C. ; Zhengang Chen

  • Author_Institution
    Univ. of Alberta, Edmonton
  • Volume
    42
  • Issue
    10
  • fYear
    2007
  • Firstpage
    2245
  • Lastpage
    2256
  • Abstract
    Low-density parity-check block codes (LDPC-BCs) are quickly becoming the forward error correcting code of choice for emerging communication standards. However, low-density parity-check convolutional codes (LDPC-CCs), the convolutional counterpart of LDPC-BCs, seem to be better suited in applications with streaming data or variable sized packets. A rate-1/2, (128,3,6) LDPC-CC ASIC has been implemented in 180-nm, 1.8-V CMOS technology. We present the VLSI architecture of a register-based LDPC-CC encoder and decoder that includes an on-chip, pseudo-random additive white Gaussian noise channel emulator. The decoder comprises a pipeline of ten identical processing units and attains up to 175 Mb/s of decoded throughput.
  • Keywords
    AWGN; CMOS integrated circuits; VLSI; application specific integrated circuits; block codes; convolutional codes; forward error correction; iterative decoding; microprocessor chips; parity check codes; ASIC; CMOS technology; VLSI architecture; bit rate 175 Mbit/s; communication standards; convolutional code; decoder; encoder; forward error correcting code; low-density parity-check block codes; processing units; pseudo-random additive white Gaussian noise channel emulator; rate-1/2 (128,3,6) code; register-based LDPC-CC; size 180 nm; voltage 1.8 V; Application specific integrated circuits; Block codes; CMOS technology; Communication standards; Convolutional codes; Decoding; Error correction codes; Parity check codes; Testing; Very large scale integration; CMOS integrated circuits; Capacity-approaching codes; convolutional codes; forward error correction; iterative decoding; low-density parity-check codes; soft decoding;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2007.905232
  • Filename
    4317713