DocumentCode :
1225540
Title :
Design and Test of a 175-Mb/s, Rate-1/2 (128,3,6) Low-Density Parity-Check Convolutional Code Encoder and Decoder
Author :
Swamy, Rajashekara ; Bates, S. ; Brandon, T.L. ; Cockburn, Bruce F. ; Elliott, Duncan G. ; Koob, J.C. ; Zhengang Chen
Author_Institution :
Univ. of Alberta, Edmonton
Volume :
42
Issue :
10
fYear :
2007
Firstpage :
2245
Lastpage :
2256
Abstract :
Low-density parity-check block codes (LDPC-BCs) are quickly becoming the forward error correcting code of choice for emerging communication standards. However, low-density parity-check convolutional codes (LDPC-CCs), the convolutional counterpart of LDPC-BCs, seem to be better suited in applications with streaming data or variable sized packets. A rate-1/2, (128,3,6) LDPC-CC ASIC has been implemented in 180-nm, 1.8-V CMOS technology. We present the VLSI architecture of a register-based LDPC-CC encoder and decoder that includes an on-chip, pseudo-random additive white Gaussian noise channel emulator. The decoder comprises a pipeline of ten identical processing units and attains up to 175 Mb/s of decoded throughput.
Keywords :
AWGN; CMOS integrated circuits; VLSI; application specific integrated circuits; block codes; convolutional codes; forward error correction; iterative decoding; microprocessor chips; parity check codes; ASIC; CMOS technology; VLSI architecture; bit rate 175 Mbit/s; communication standards; convolutional code; decoder; encoder; forward error correcting code; low-density parity-check block codes; processing units; pseudo-random additive white Gaussian noise channel emulator; rate-1/2 (128,3,6) code; register-based LDPC-CC; size 180 nm; voltage 1.8 V; Application specific integrated circuits; Block codes; CMOS technology; Communication standards; Convolutional codes; Decoding; Error correction codes; Parity check codes; Testing; Very large scale integration; CMOS integrated circuits; Capacity-approaching codes; convolutional codes; forward error correction; iterative decoding; low-density parity-check codes; soft decoding;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2007.905232
Filename :
4317713
Link To Document :
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