Title :
An accurate broadband measurement of substrate dielectric constant
Author :
Lee, Moon-Que ; Nam, Sangwook
Author_Institution :
Inst. of New Media Commun., Seoul Nat. Univ., South Korea
fDate :
4/1/1996 12:00:00 AM
Abstract :
An improved two-microstrip line method is proposed for a simple and accurate measurement of the dielectric constants of substrates. The errors due to the transition mismatches and connection repeatability are removed by using the selection algorithm of the best data set in multiple measurements, based on the minimum error cost concept. The measurement data for CGP-500 substrate in broad frequency range (0.5-25.5 GHz) are shown and the result agrees quite well with the theoretical one
Keywords :
measurement errors; microstrip lines; microwave measurement; permittivity measurement; 0.5 to 25.5 GHz; CGP-500 substrate; broadband measurement; connection repeatability; minimum error cost concept; multiple measurements; selection algorithm; substrate dielectric constant; transition mismatches; two-microstrip line method; Coaxial components; Dielectric constant; Dielectric measurements; Dielectric substrates; Impedance; Microstrip; Microwave measurements; Transmission line matrix methods; Transmission line measurements; Transmission line theory;
Journal_Title :
Microwave and Guided Wave Letters, IEEE
