• DocumentCode
    1226053
  • Title

    More accurate breakdown voltage estimation for the new step-up test method

  • Author

    Hirose, Hideo

  • Author_Institution
    Dept. of Control & Eng. Sci., Kyushu Inst. of Technol., Fukuoka, Japan
  • Volume
    10
  • Issue
    3
  • fYear
    2003
  • fDate
    6/1/2003 12:00:00 AM
  • Firstpage
    475
  • Lastpage
    482
  • Abstract
    The step-up method is used to estimate the impulse breakdown voltages when the electrical insulation is not usable after it is broken. This paper analyses the reliability of the estimates of the underlying breakdown probability distribution in the step-up method, when (1) the observed breakdown voltage itself is available and (2) it is not available. The former case has many advantages compared to the latter case such that (i) the confidence intervals of the estimates become smaller and (ii) the estimates can be obtained with higher probability. Consequently, this paper recommends using the estimates of the underlying distribution for the breakdown voltages instead of the nominal breakdown voltages. Some illustrative examples are given.
  • Keywords
    electric breakdown; impulse testing; insulation testing; probability; voltage measurement; breakdown probability distribution; confidence intervals; electrical insulation; impulse breakdown voltage estimation; insulation breakdown tests; reliability; step-up test method; Automatic testing; Breakdown voltage; Computer science; Dielectrics and electrical insulation; Flashover; Gaussian distribution; Impulse testing; Insulation testing; Stress; System testing;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2003.1207475
  • Filename
    1207475