DocumentCode :
1226053
Title :
More accurate breakdown voltage estimation for the new step-up test method
Author :
Hirose, Hideo
Author_Institution :
Dept. of Control & Eng. Sci., Kyushu Inst. of Technol., Fukuoka, Japan
Volume :
10
Issue :
3
fYear :
2003
fDate :
6/1/2003 12:00:00 AM
Firstpage :
475
Lastpage :
482
Abstract :
The step-up method is used to estimate the impulse breakdown voltages when the electrical insulation is not usable after it is broken. This paper analyses the reliability of the estimates of the underlying breakdown probability distribution in the step-up method, when (1) the observed breakdown voltage itself is available and (2) it is not available. The former case has many advantages compared to the latter case such that (i) the confidence intervals of the estimates become smaller and (ii) the estimates can be obtained with higher probability. Consequently, this paper recommends using the estimates of the underlying distribution for the breakdown voltages instead of the nominal breakdown voltages. Some illustrative examples are given.
Keywords :
electric breakdown; impulse testing; insulation testing; probability; voltage measurement; breakdown probability distribution; confidence intervals; electrical insulation; impulse breakdown voltage estimation; insulation breakdown tests; reliability; step-up test method; Automatic testing; Breakdown voltage; Computer science; Dielectrics and electrical insulation; Flashover; Gaussian distribution; Impulse testing; Insulation testing; Stress; System testing;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/TDEI.2003.1207475
Filename :
1207475
Link To Document :
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