DocumentCode
1226062
Title
The influence of the dielectric strength of the N2/SF6-insulation by conducting particle on the spacer surface
Author
Imano, A. Moukengué
Author_Institution
Inst. of Technol., Univ. of Douala, Cameroon
Volume
10
Issue
3
fYear
2003
fDate
6/1/2003 12:00:00 AM
Firstpage
483
Lastpage
490
Abstract
This paper investigates the dielectric properties of various N2/SF6 gas mixtures based upon a cylindrical spacer model with adhering particle on the surface tinder homogeneous field conditions. The investigation involves a comparison with pure SF6. The flashover field strength for clean and particle contaminated spacer surface under AC and LI stress is determined. The results of the investigations show the sensitivity of N2/SF6 gas mixtures to conducting particles on spacer surfaces for gas pressures up to 800 kPa. Moreover, the correspondence between pure SF6 at pressure range from 100 to 400 kPa and N2/SF6 gas mixtures for AC and lightning impulse (LI) flashover field strength range from 50 to 178 kV/cm is determined. Conclusions are drawn about the ability of SF6 gas mixtures to serve as technically efficient media for GIS/GITL. The results shed light on the issue of the SF6 reduction and particle detectability in GIS/GITL.
Keywords
SF6 insulation; electric strength; flashover; gas insulated substations; gas insulated transmission lines; gas mixtures; insulation testing; nitrogen; 100 to 400 kPa; 800 kPa; N2-SF6; N2/SF6 gas mixtures; adhering particle; cylindrical spacer model; dielectric strength; flashover field strength; gas insulated substations; gas insulated transmission lines; gas pressures; homogeneous field conditions; insulation breakdown testing; lightning impulse stress; particle detectability; spacer surfaces; Dielectric breakdown; Dielectrics and electrical insulation; Flashover; Gas insulated transmission lines; Gas insulation; Gases; Geographic Information Systems; Nitrogen; Surface cleaning; Surface contamination;
fLanguage
English
Journal_Title
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
1070-9878
Type
jour
DOI
10.1109/TDEI.2003.1207476
Filename
1207476
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