DocumentCode :
1226110
Title :
Monte Carlo simulation of gamma ray spectra from semiconductor detectors
Author :
Olschner, F. ; Lund, J.C. ; Stern, I.
Author_Institution :
Radiat. Monitoring Devices Inc., Watertown, MA, USA
Volume :
36
Issue :
1
fYear :
1989
fDate :
2/1/1989 12:00:00 AM
Firstpage :
1176
Lastpage :
1179
Abstract :
Monte Carlo techniques have been used to simulate gamma-ray pulse-height spectra from rectangularly shaped CdTe detectors in the energy range of a few keV to approximately 1 MeV. The simulation results were found to agree well with measured CdTe gamma-ray pulse-height spectra. The various physical events occurring within the detector are simulated in a naturally sequential manner. Specifically, the algorithm simulates such effects as exponentially absorbed radiation, multiple Compton scattering within the detector, charge-carrier trapping, and electronic noise (Gaussian). Advantages of this simulation method are the compactness of the code (allowing the use of microcomputers) and speed of operation (approximately 15 events per second)
Keywords :
Monte Carlo methods; gamma-ray spectra; semiconductor counters; CdTe detectors; Monte Carlo simulation; charge-carrier trapping; electronic noise; exponentially absorbed radiation; gamma ray spectra; gamma-ray pulse-height spectra; multiple Compton scattering; semiconductor detectors; Discrete event simulation; Electron traps; Event detection; Gamma ray detection; Gamma ray detectors; Monte Carlo methods; Pulse measurements; Pulse shaping methods; Radiation detectors; Scattering;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.34627
Filename :
34627
Link To Document :
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