DocumentCode :
122639
Title :
Research on the effect of induced voltages in transient stability for multi circuit modeling on 500 kV EHV parallel transmission lines using a modified genetic algorithm
Author :
Jaipradidtham, Chamni ; Naksuriyavong, Artiwat
Author_Institution :
Dept. of Electr. Eng., Kasem Bundit Univ., Bangkok, Thailand
fYear :
2014
fDate :
19-21 March 2014
Firstpage :
1
Lastpage :
4
Abstract :
This paper presents for modeling of the 500 kV EHV parallel transmission lines of multi circuit for the effect of induced voltages in transient stability due to a direct strokes using a modified genetic algorithm. The study of induction from the energized line with higher voltage(HV)level is more than the induction from the energized line with lower voltage level. Phase sequencing and transposition of lines, which changes the distance between the energized, effects the induced voltage in each section along the lines. The grounding of sending and receiving ends of energized lines causes high induced current in the circuit. The ground switch is connected to ground for off-service long transmission line to discharge to because the voltage in hotline circuit can induce to open line using a modified genetic algorithm. The voltage must be calculated along the distance of transmission line to fix the ground point connected by for safety of operator.
Keywords :
earthing; genetic algorithms; power system transient stability; power transmission protection; EHV parallel transmission lines; energized lines; hotline circuit; induced voltages; modified genetic algorithm; multicircuit modeling; off-service long transmission line; operator safety; phase sequencing; transient stability; voltage 500 kV; Biological cells; Conductors; Indexes; Joining processes; PSCAD; Resource management; 500 kV EHV transmission lines model; genetic algorithm; induced voltages; transient stability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Engineering Congress (iEECON), 2014 International
Conference_Location :
Chonburi
Type :
conf
DOI :
10.1109/iEECON.2014.6925915
Filename :
6925915
Link To Document :
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