• DocumentCode
    1226622
  • Title

    Poling-induced waveguide polarizers in electrooptic polymers

  • Author

    Oh, Min-Cheol ; Shin, Sang-Yung ; Hwang, Wol-Yon ; Kim, Jang-Joo

  • Author_Institution
    Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea
  • Volume
    8
  • Issue
    3
  • fYear
    1996
  • fDate
    3/1/1996 12:00:00 AM
  • Firstpage
    375
  • Lastpage
    377
  • Abstract
    In order to demonstrate polymeric waveguide polarizers, photobleached polymer waveguides supporting both TE and TM modes are integrated with poling induced polymer waveguides that support either TE or TM modes. Fabrication parameters like UV exposures and poling voltages are controlled to reduce excess losses due to the mode profile mismatch between the connected waveguides. A TM-pass polarizer is realized by poling the polymer in the vertical direction. For TE-pass polarizer the polymer is poled horizontally by using four poling electrodes which enhance the uniformity of the poling field direction. The measured excess loss is less than 0.5 dB, and polarization extinction ratios for TM-pass and TE-pass polarizers are 20.7 dB and 17.1 dB, respectively.
  • Keywords
    electro-optical devices; integrated optics; optical fabrication; optical losses; optical polarisers; optical polymers; optical waveguide components; 0.5 dB; TE modes; TE-pass polarizer; TM modes; TM-pass polarizer; UV exposures; channel waveguides; electrooptic polymers; excess loss; excess losses; fabrication parameters; four poling electrodes; mode profile mismatch; photobleached polymer waveguides; polarization extinction ratios; poling field direction; poling voltages; poling-induced waveguide polarizers; polymeric waveguide polarizers; vertical direction; Electrodes; Electrooptical waveguides; Extinction ratio; Loss measurement; Optical device fabrication; Photobleaching; Polarization; Polymers; Tellurium; Voltage control;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/68.481122
  • Filename
    481122