DocumentCode
1227007
Title
A conformance tester for X.25 DTE implementations
Author
Peng, Hanwei ; Su, David H. ; Wakid, Shukri A.
Volume
3
Issue
4
fYear
1989
fDate
7/1/1989 12:00:00 AM
Firstpage
27
Lastpage
30
Abstract
The authors review briefly the testing architecture of ISO 9646, a standard for defining testing methodology and architecture for all of the ISO Open Systems Interconnection layers. They then describe the test systems of the US National Institute for Standards and Technology for both the link and packet layers, and, for vendors interfacing their data terminal equipment to DDN. They explain how conformance to the Defense Data Network (DDN) X.25 interface can be verified. They also discuss the possibility of porting the test system to other test equipment.<>
Keywords
automatic test equipment; conformance testing; data communication equipment; electronic equipment testing; standards; DDN; Defense Data Network; ISO 9646; ISO Open Systems Interconnection layers; US National Institute for Standards and Technology; X.25 DTE; X.25 interface; conformance tester; data terminal equipment; link layer; packet layer; protocols; standard; test equipment; test systems; testing architecture; Atherosclerosis; Certification; Displays; NIST; Protocols; System testing; Test equipment;
fLanguage
English
Journal_Title
Network, IEEE
Publisher
ieee
ISSN
0890-8044
Type
jour
DOI
10.1109/65.34742
Filename
34742
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