Title :
Infrared: A New Approach for Higher Reliability
Author :
Vanzetti, Riccardo
Author_Institution :
Raytheon Company
Abstract :
This paper contains some of the essential data of the oral presentation, which in turn summarizes the results of three years of work performed by the author in this field.
Keywords :
Assembly; Electromagnetic radiation; Electronic components; Infrared detectors; Radiation detectors; Radiative recombination; Spontaneous emission; Temperature; Thermal resistance; Wavelength measurement;
Journal_Title :
Aerospace, IEEE Transactions on
DOI :
10.1109/TA.1963.4319426
