Voltage and lamp flicker issues: should the IEEE adopt the IEC approach?

Author

Halpin, S. Mark ; Bergeron, Roger ; Blooming, Tom M. ; Burch, Reuben F. ; Conrad, Larry E. ; Key, Thomas S.

Author_Institution

Dept. of Electr. & Comput. Eng., Auburn Univ., Montgomery, AL, USA

Volume

18

Issue

3

fYear

2003

fDate

7/1/2003 12:00:00 AM

Firstpage

1088

Lastpage

1097

Abstract

This paper is intended to provide an overview of the IEC flicker measurement and assessment procedures. The IEC procedures are correlated with existing IEEE flicker standards to show the benefits of the IEC methodology. Application issues, such as customer impact assessment, are also discussed. Three case studies, two field tests, and one EMTP analysis are provided to show the correlation of IEC flickermeter output values with documented customer complaints. The case studies also provide areas where modifications to the IEC flicker standards may be necessary when developing a new IEEE flicker standard.

Keywords

IEC standards; IEEE standards; harmonic distortion; lamps; power supply quality; power system harmonics; IEC flicker assessment; IEC flicker measurement; IEC flicker standards; IEEE flicker standards; Lamp Flicker; application issues; case studies; customer impact assessment; voltage flicker; Associate members; EMTP; Frequency; IEC standards; Instruments; Lamps; Standards development; Testing; Threshold voltage; Voltage fluctuations;

fLanguage

English

Journal_Title

Power Delivery, IEEE Transactions on

Publisher

ieee

ISSN

0885-8977

Type

jour

DOI

10.1109/TPWRD.2003.814261

Filename

1208402