Title :
A 2.7-V 1.8-GHz fourth-order tunable LC bandpass filter based on emulation of magnetically coupled resonators
Author :
Mohieldin, Ahmed Nader ; Sánchez-Sinencio, Edgar ; Silva-Martínez, José
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
fDate :
7/1/2003 12:00:00 AM
Abstract :
A low-voltage fourth-order RF bandpass filter structure based on emulation of two magnetically coupled resonators is presented. A unique feature of the proposed architecture is using electric coupling to emulate the effect of the coupled inductors, thus providing bandwidth tuning with small passband ripple. Each resonator is built using on-chip spiral inductors and accumulation-mode pMOS capacitors to provide center frequency tuning. The filter has been implemented in HP 0.5-μm CMOS process and occupies an area of 0.15 mm2. It consumes 16 mA from a single 2.7-V supply at a center frequency of 1.84 GHz and a bandwidth of 80 MHz while providing a passband gain of 9 dB and more than 30 dB of image attenuation for an IF frequency of 100 MHz. The measured output 1-dB compression point and output noise power spectral densities are -16 dBm and -137 dBm/Hz, respectively. This results in a 1-dB compression dynamic range of 42 dB. The filter minimum power supply voltage for proper operation is 2 V. The chip experimental results are in good agreement with theoretical results.
Keywords :
CMOS analogue integrated circuits; UHF filters; UHF integrated circuits; band-pass filters; circuit tuning; low-power electronics; resonator filters; 0.5 micron; 1.8 GHz; 16 mA; 2.7 V; 80 MHz; 9 dB; CMOS process; accumulation-mode pMOS capacitor; compression point; dynamic range; electric emulation; image attenuation; low-voltage fourth-order RF bandpass filter; magnetically coupled resonators; noise power spectral density; spiral inductor; tunable LC filter; Band pass filters; Bandwidth; Couplings; Emulation; Frequency; Image coding; Inductors; Magnetic separation; Passband; Tuning;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2003.813228