• DocumentCode
    1228552
  • Title

    A 0.5-V 1-μW successive approximation ADC

  • Author

    Sauerbrey, Jens ; Schmitt-Landsiedel, Doris ; Thewes, Roland

  • Author_Institution
    Corporate Res., Infineon Technol. AG, Munich, Germany
  • Volume
    38
  • Issue
    7
  • fYear
    2003
  • fDate
    7/1/2003 12:00:00 AM
  • Firstpage
    1261
  • Lastpage
    1265
  • Abstract
    A successive approximation analog-to-digital converter (ADC) is presented operating at ultralow supply voltages. The circuit is realized in a 0.18-μm standard CMOS technology. Neither low-VT devices nor voltage boosting techniques are used. All voltage levels are between supply voltage VDD and ground VSS. A passive sample-and-hold stage and a capacitor-based digital-to-analog converter are used to avoid application of operational amplifiers, since opamp operation requires higher values for the lowest possible supply voltage. The ADC has signal-to-noise-and-distortion ratios of 51.2 and 43.3 dB for supply voltages of 1 and 0.5 V, at sampling rates of 150 and 4.1 kS/s and power consumptions of 30 and 0.85 μW, respectively. Proper operation is achieved down to a supply voltage of 0.4 V.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; low-power electronics; sample and hold circuits; 0.18 micron; 0.5 V; 1 muW; CMOS technology; capacitor-based digital-to-analog converter; passive sample-and-hold stage; power consumption; sampling rate; signal-to-noise-and-distortion ratio; successive approximation analog-to-digital converter; ultralow voltage operation; Analog circuits; Analog-digital conversion; CMOS technology; Circuit testing; Clocks; Digital-analog conversion; Energy consumption; Sampling methods; Switching circuits; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2003.813217
  • Filename
    1208477