DocumentCode :
1228552
Title :
A 0.5-V 1-μW successive approximation ADC
Author :
Sauerbrey, Jens ; Schmitt-Landsiedel, Doris ; Thewes, Roland
Author_Institution :
Corporate Res., Infineon Technol. AG, Munich, Germany
Volume :
38
Issue :
7
fYear :
2003
fDate :
7/1/2003 12:00:00 AM
Firstpage :
1261
Lastpage :
1265
Abstract :
A successive approximation analog-to-digital converter (ADC) is presented operating at ultralow supply voltages. The circuit is realized in a 0.18-μm standard CMOS technology. Neither low-VT devices nor voltage boosting techniques are used. All voltage levels are between supply voltage VDD and ground VSS. A passive sample-and-hold stage and a capacitor-based digital-to-analog converter are used to avoid application of operational amplifiers, since opamp operation requires higher values for the lowest possible supply voltage. The ADC has signal-to-noise-and-distortion ratios of 51.2 and 43.3 dB for supply voltages of 1 and 0.5 V, at sampling rates of 150 and 4.1 kS/s and power consumptions of 30 and 0.85 μW, respectively. Proper operation is achieved down to a supply voltage of 0.4 V.
Keywords :
CMOS integrated circuits; analogue-digital conversion; low-power electronics; sample and hold circuits; 0.18 micron; 0.5 V; 1 muW; CMOS technology; capacitor-based digital-to-analog converter; passive sample-and-hold stage; power consumption; sampling rate; signal-to-noise-and-distortion ratio; successive approximation analog-to-digital converter; ultralow voltage operation; Analog circuits; Analog-digital conversion; CMOS technology; Circuit testing; Clocks; Digital-analog conversion; Energy consumption; Sampling methods; Switching circuits; Threshold voltage;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2003.813217
Filename :
1208477
Link To Document :
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