• DocumentCode
    1228846
  • Title

    Measurement of dielectric loss tangent of alumina at microwave frequencies and room temperature

  • Author

    Woode, R.A. ; Ivanov, E.N. ; Tobar, M.E. ; Blair, D.G.

  • Author_Institution
    Dept. of Phys., Western Australia Univ., Nedlands, WA
  • Volume
    30
  • Issue
    25
  • fYear
    1994
  • fDate
    12/8/1994 12:00:00 AM
  • Firstpage
    2120
  • Lastpage
    2122
  • Abstract
    The use of whispering gallery modes allows the dielectric loss tangent of polycrystalline Al2O3 (alumina) to be accurately determined at microwave frequencies without the use of a cavity. The dielectric loss tangent of alumina is shown to be strongly variable from sample to sample with a lowest measured value of 4.3×10-5 observed at 9.0 GHz in a 99.5% alumina sample
  • Keywords
    alumina; dielectric loss measurement; microwave measurement; 9 GHz; Al2O3; alumina; dielectric loss tangent measurement; microwave frequencies; polycrystalline material; room temperature; whispering gallery modes;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19941470
  • Filename
    350157
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1228846