• DocumentCode
    1228878
  • Title

    Conductive Carbon as a Novel Front-End Electrode Material for a Trench DRAM

  • Author

    Boscke, T.S. ; Guerrero, Gilles ; Liebau, Maik ; Uppal, Suresh ; Lee, Yu Pi ; Pethe, Wieland ; Patz, Matthias ; Kleye, Albrecht ; Su, Pin-Yuan ; Orth, Andreas ; Liu, Wen-Chung ; Lützen, Joern

  • Author_Institution
    Qimonda Dresden, Dresden
  • Volume
    30
  • Issue
    5
  • fYear
    2009
  • fDate
    5/1/2009 12:00:00 AM
  • Firstpage
    442
  • Lastpage
    444
  • Abstract
    We report on the electronic properties and application of conductive carbon as a novel front-end material. Conductive carbon is attractive due to its metallic properties, high thermal stability, compatibility to Si-based dielectrics, and the availability of a low-cost batch deposition process. Here, we utilize carbon instead of a polysilicon top electrode in a deep trench capacitor with SiON node dielectric. A capacitance gain of 10% is observed due to suppression of electronic depletion. Furthermore, the midgap work function of 4.4 eV leads to a reduction of leakage currents due to a higher tunneling barrier. This allows electric thinning of the dielectric for a total capacitance gain of 20%, compared to a polysilicon electrode, while maintaining excellent electronic reliability characteristics.
  • Keywords
    DRAM chips; capacitors; carbon; conducting materials; dielectric materials; thermal stability; C-SiON; conductive carbon; deep trench capacitor; electric thinning; electronic properties; electronic reliability; front-end electrode material; polysilicon electrode; polysilicon top electrode; thermal stability; trench DRAM; Carbon; dynamic random access memory (DRAM); metal electrode; storage dielectric;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2009.2015343
  • Filename
    4812039