• DocumentCode
    1229386
  • Title

    On correlating TEM cell and OATS emission measurements

  • Author

    Wilson, P.

  • Author_Institution
    EMC Baden, Switzerland
  • Volume
    37
  • Issue
    1
  • fYear
    1995
  • fDate
    2/1/1995 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    16
  • Abstract
    The use of single-port broad-band TEM cells for both near-field and far-field radiated emission testing is considered. The approach is to model the radiation from the device under test (DUT) as due to an equivalent set of multipoles. Assuming the DUT is electrically small only the initial multipole moments, the electric and magnetic dipole terms, need be retained. A sequence of TEM cell measurements is then used to determine the equivalent DUT dipole moments, The dipole model then allows one to simulate DUT emissions both in free space and over a ground screen. Thus, emission measurements over an open area test site (OATS) as called for by various standards may be simulated. Such measurement schemes have previously been successfully developed for standard two port TEM cells. However, certain broad-band TEM cells are single-port devices; thus, some modification of the previous approach is required. This paper reviews the basics of the multipole model as it relates to TEM cells, details various measurement schemes appropriate to single-port TEM cells, and presents examples of measured emission data, both near field and far field, in all cases considered, the correlation between emission data measured directly over a ground screen and simulated ground screen data based on TEM cell measurements is excellent
  • Keywords
    antenna testing; electromagnetic compatibility; OATS emission; TEM cell; device under test; electric dipole term; far-field radiated emission testing; free space; ground screen; magnetic dipole term; model; multipole moments; near-field radiated emission testing; open area test site; single-port broad-band; Area measurement; Conductors; Frequency; Magnetic field measurement; Magnetic moments; Measurement standards; Open area test sites; Phase measurement; TEM cells; Testing;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/15.350235
  • Filename
    350235