DocumentCode :
1229392
Title :
Self-Adaptive Data Caches for Soft-Error Reliability
Author :
Wang, Shuai ; Hu, Jie ; Ziavras, Sotirios G.
Author_Institution :
Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ
Volume :
27
Issue :
8
fYear :
2008
Firstpage :
1503
Lastpage :
1507
Abstract :
Soft-error induced reliability problems have become a major challenge in designing new generation microprocessors. Due to the on-chip caches´ dominant share in die area and transistor budget, protecting them against soft errors is of paramount importance. Recent research has focused on the design of cost-effective reliable data caches in terms of performance, energy, and area overheads, based on the assumption of fixed error rates. However, for systems in operating environments that vary with time or location, those schemes will be either insufficient or overdesigned for the changing error rates. In this paper, we explore the design of a self-adaptive reliable data cache that dynamically adapts its employed reliability schemes to the changing operating environments thus to maintain a target reliability. The proposed data cache is implemented with three levels of error protection schemes, a monitoring mechanism, and a control component that decides whether to upgrade, downgrade, or keep the current protection level based on the feedback from the monitor. Our experimental evaluation using a set of SPEC CPU2000 benchmarks shows that our self-adaptive data cache achieves similar reliability to a cache protected by the most reliable scheme, while simultaneously minimizing the performance and power overheads.
Keywords :
cache storage; integrated circuit reliability; microprocessor chips; radiation hardening (electronics); SPEC CPU2000 benchmarks; current protection level; error protection; microprocessors; monitoring mechanism; on-chip caches; power overheads; self-adaptive data caches; soft-error reliability; Data cache; Reliability; data cache; reliability; reliable system design; self adaptation; soft error;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2008.925789
Filename :
4527119
Link To Document :
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