DocumentCode
1229392
Title
Self-Adaptive Data Caches for Soft-Error Reliability
Author
Wang, Shuai ; Hu, Jie ; Ziavras, Sotirios G.
Author_Institution
Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ
Volume
27
Issue
8
fYear
2008
Firstpage
1503
Lastpage
1507
Abstract
Soft-error induced reliability problems have become a major challenge in designing new generation microprocessors. Due to the on-chip caches´ dominant share in die area and transistor budget, protecting them against soft errors is of paramount importance. Recent research has focused on the design of cost-effective reliable data caches in terms of performance, energy, and area overheads, based on the assumption of fixed error rates. However, for systems in operating environments that vary with time or location, those schemes will be either insufficient or overdesigned for the changing error rates. In this paper, we explore the design of a self-adaptive reliable data cache that dynamically adapts its employed reliability schemes to the changing operating environments thus to maintain a target reliability. The proposed data cache is implemented with three levels of error protection schemes, a monitoring mechanism, and a control component that decides whether to upgrade, downgrade, or keep the current protection level based on the feedback from the monitor. Our experimental evaluation using a set of SPEC CPU2000 benchmarks shows that our self-adaptive data cache achieves similar reliability to a cache protected by the most reliable scheme, while simultaneously minimizing the performance and power overheads.
Keywords
cache storage; integrated circuit reliability; microprocessor chips; radiation hardening (electronics); SPEC CPU2000 benchmarks; current protection level; error protection; microprocessors; monitoring mechanism; on-chip caches; power overheads; self-adaptive data caches; soft-error reliability; Data cache; Reliability; data cache; reliability; reliable system design; self adaptation; soft error;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2008.925789
Filename
4527119
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