• DocumentCode
    1229400
  • Title

    Efficient Extraction of Frequency-Dependent Substrate Parasitics Using Direct Boundary Element Method

  • Author

    Yu, Wenjian ; Wang, Xiren ; Ye, Zuochang ; Wang, Zeyi

  • Author_Institution
    Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing
  • Volume
    27
  • Issue
    8
  • fYear
    2008
  • Firstpage
    1508
  • Lastpage
    1513
  • Abstract
    An efficient method based on a direct boundary element method is proposed for extracting frequency-dependent substrate coupling parameters. A frequency-independent real-valued linear equation system is first solved. Then, the solution is transformed into frequency-dependent parameters at a specified frequency with the Sherman-Morrison-Woodbury formula. The first step is performed only once for a given structure, and the method is very efficient for extraction with multiple frequencies. The proposed method is compared with the Green´s function-based method and the approach in our earlier paper for typical substrate structures. Numerical results demonstrate its accuracy, efficiency, and versatility.
  • Keywords
    boundary-elements methods; integrated circuit design; mixed analogue-digital integrated circuits; radiofrequency integrated circuits; silicon; RF circuit design; Sherman-Morrison-Woodbury formula; direct boundary element method; frequency-dependent substrate parasitics; mixed-signal circuit design; real-valued linear equation system; silicon substrate coupling parameter; Arbitrary substrate profile; Sherman–Morrison–Woodbury formula; Sherman-Morrison-Woodbury formula; direct boundary element method (DBEM); frequency-dependent parameter extraction;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2008.925787
  • Filename
    4527120