DocumentCode :
1229400
Title :
Efficient Extraction of Frequency-Dependent Substrate Parasitics Using Direct Boundary Element Method
Author :
Yu, Wenjian ; Wang, Xiren ; Ye, Zuochang ; Wang, Zeyi
Author_Institution :
Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing
Volume :
27
Issue :
8
fYear :
2008
Firstpage :
1508
Lastpage :
1513
Abstract :
An efficient method based on a direct boundary element method is proposed for extracting frequency-dependent substrate coupling parameters. A frequency-independent real-valued linear equation system is first solved. Then, the solution is transformed into frequency-dependent parameters at a specified frequency with the Sherman-Morrison-Woodbury formula. The first step is performed only once for a given structure, and the method is very efficient for extraction with multiple frequencies. The proposed method is compared with the Green´s function-based method and the approach in our earlier paper for typical substrate structures. Numerical results demonstrate its accuracy, efficiency, and versatility.
Keywords :
boundary-elements methods; integrated circuit design; mixed analogue-digital integrated circuits; radiofrequency integrated circuits; silicon; RF circuit design; Sherman-Morrison-Woodbury formula; direct boundary element method; frequency-dependent substrate parasitics; mixed-signal circuit design; real-valued linear equation system; silicon substrate coupling parameter; Arbitrary substrate profile; Sherman–Morrison–Woodbury formula; Sherman-Morrison-Woodbury formula; direct boundary element method (DBEM); frequency-dependent parameter extraction;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2008.925787
Filename :
4527120
Link To Document :
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