DocumentCode :
1229462
Title :
Delay Uncertainty Reduction by Gate Splitting
Author :
Agarwal, Vineet ; Sun, Jin ; Wang, Janet M.
Author_Institution :
Intel Corp., Folsom, CA
Volume :
56
Issue :
4
fYear :
2009
fDate :
4/1/2009 12:00:00 AM
Firstpage :
295
Lastpage :
299
Abstract :
Traditional timing-variation reduction techniques are only able to decrease gate delay variation by incurring a delay overhead. In this brief, we propose a novel and effective splitting-based variation reduction technique for gates. We developed a new tool called Timing Uncertainty Reduction by Gate Splitting (TURGS), which reduces the timing variations of a circuit and presents little delay overhead at the primary output. Our experimental results show that TURGS achieves up to 20% improvement in timing variation for gates.
Keywords :
delays; field effect transistors; delay uncertainty reduction; effective splitting-based variation reduction; gate delay; gate splitting; primary output; timing-variation reduction; Delay uncertainty reduction; gate cloning; gate split; process variation;
fLanguage :
English
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-7747
Type :
jour
DOI :
10.1109/TCSII.2009.2015394
Filename :
4812091
Link To Document :
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