Title :
Delay Uncertainty Reduction by Gate Splitting
Author :
Agarwal, Vineet ; Sun, Jin ; Wang, Janet M.
Author_Institution :
Intel Corp., Folsom, CA
fDate :
4/1/2009 12:00:00 AM
Abstract :
Traditional timing-variation reduction techniques are only able to decrease gate delay variation by incurring a delay overhead. In this brief, we propose a novel and effective splitting-based variation reduction technique for gates. We developed a new tool called Timing Uncertainty Reduction by Gate Splitting (TURGS), which reduces the timing variations of a circuit and presents little delay overhead at the primary output. Our experimental results show that TURGS achieves up to 20% improvement in timing variation for gates.
Keywords :
delays; field effect transistors; delay uncertainty reduction; effective splitting-based variation reduction; gate delay; gate splitting; primary output; timing-variation reduction; Delay uncertainty reduction; gate cloning; gate split; process variation;
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
DOI :
10.1109/TCSII.2009.2015394