Title :
LabVIEW-Based UHF RFID Tag Test and Measurement System
Author :
Nikitin, Pavel V. ; Rao, K. V Seshagiri
Author_Institution :
Intermec Technol. Corp., Everett, WA
fDate :
7/1/2009 12:00:00 AM
Abstract :
In this paper, we describe a UHF radio-frequency-identification tag test and measurement system based on National Instruments LabVIEW-controlled PXI RF hardware. The system operates in 800-1000-MHz frequency band with a variable output power up to 30 dBm and is capable of testing tags using Gen2 and other protocols. We explain testing methods and metrics, describe in detail the construction of our system, show its operation with real tag measurement examples, and draw general conclusions.
Keywords :
UHF measurement; automatic test equipment; data acquisition; measurement systems; peripheral interfaces; radiofrequency identification; virtual instrumentation; Gen2 protocol; National Instruments LabVIEW; PXI RF hardware; UHF RFID tag test system; frequency 800 MHz to 1000 MHz; measurement system; radio-frequency-identification tag test; Radio-frequency identification (RFID); tags; testing and measurement;
Journal_Title :
Industrial Electronics, IEEE Transactions on
DOI :
10.1109/TIE.2009.2018434
