Title :
Single-event effects ground testing and on-orbit rate prediction methods: the past, present, and future
Author :
Reed, Robert A. ; Kinnison, James ; Pickel, Jim C. ; Buchner, Stephen ; Marshall, Paul W. ; Kniffin, Scott ; LaBel, Kenneth A.
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD, USA
fDate :
6/1/2003 12:00:00 AM
Abstract :
Over the past 27 years, or so, increased concern over single-event effects (SEEs) in spacecraft systems has resulted in research, development, and engineering activities centered around a better understanding of the space radiation environment, SEE predictive methods, ground test protocols, and test facility developments. This research has led to fairly well developed methods for assessing the impact of the space radiation environment on systems that contain SEE sensitive devices and the development of mitigation strategies either at the system or device level. However, as new technology has emerged, these ground test and predictive methods have certain short falls.
Keywords :
nuclear electronics; prediction theory; radiation effects; radiation monitoring; space vehicles; 27 y; ground test protocols; ground testing; on-orbit rate prediction methods; predictive methods; single-event effects; space radiation environment; spacecraft systems; Frequency estimation; Ionization; Microelectronics; NASA; Prediction methods; Radiation effects; Space technology; Space vehicles; System testing; Test facilities;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2003.813331