DocumentCode
1229607
Title
Intense Sheet Electron Beam Transport in a Uniform Solenoidal Magnetic Field
Author
Nguyen, Khanh T. ; Pasour, John A. ; Antonsen, Thomas M., Jr. ; Larsen, Paul B. ; Petillo, John J. ; Levush, Baruch
Author_Institution
Beam-Wave Res., Inc., Bethesda, MD
Volume
56
Issue
5
fYear
2009
fDate
5/1/2009 12:00:00 AM
Firstpage
744
Lastpage
752
Abstract
In this paper, the transport of intense sheet electron beams in a uniform solenoidal magnetic field in high-power vacuum electronic devices is theoretically examined with the 3-D beam optics code MICHELLE. It is shown that a solenoidal magnetic field can be an effective transport mechanism for sheet electron beams, provided the beam tunnel is matched to the beam shape, and vice versa. The advantage of solenoidal magnetic field transport relative to periodic magnetic transport resides in the feasibility of transporting higher current density beams due to the higher average field strength achievable in practice and the lower susceptibility to field errors from mechanical misalignments. In addition, a solenoidally transported electron beam is not susceptible to voltage cutoff as in a periodic magnetic focusing system; hence, device efficiency is potentially higher.
Keywords
current density; electron beams; solenoids; vacuum microelectronics; 3-D beam optics code; MICHELLE; beam shape; beam tunnel; current density beams; field errors; field strength; high-power vacuum electronic devices; intense sheet electron beam transport; mechanical misalignments; periodic magnetic focusing system; periodic magnetic transport; solenoidally transported electron beam; uniform solenoidal magnetic field; voltage cutoff; Current density; Electron beams; Electron optics; Magnetic devices; Magnetic fields; Magnetic susceptibility; Optical beams; Optical devices; Shape; Voltage; $vec{E} times vec{B}$ drift; Amplifier; Brillouin flow; beam transport; diocotron instability; periodic permanent magnet (PPM); sheet beam; solenoidal magnetic field;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2009.2015420
Filename
4812105
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