A Universal Geometry for Calculable Frequency-Response Coefficient of LCR Standards and New 10-MHz Resistance and 1.6-MHz Quadrature-Bridge Systems

Author

Fujimoto, Hiroshi ; Mana, G. ; Nakayama, Keisuke

Author_Institution

Nat. Metrol. Inst. of Japan, Ibaraki

Volume

56

Issue

2

fYear

2007

fDate

4/1/2007 12:00:00 AM

Firstpage

221

Lastpage

225

Abstract

We present the results of a joint project to identify the origin of a discrepancy between the value of the Si lattice-parameter obtained by the Istituto Nazionale di Ricerca Metrologica and that obtained by the National Metrology Institute of Japan. The re-evaluation of diffraction in the laser interferometry indicates that misalignment of the interfering beams could account for the observed difference

Keywords

lattice constants; light diffraction; light interferometry; silicon; INRIM; NMIJ; Si; fundamental constants; laser interferometry; measurement discrepancy; silicon lattice parameter; Bridge circuits; Coaxial components; Electrical resistance measurement; Frequency measurement; Geometry; Hafnium; Impedance measurement; Laboratories; Measurement standards; Standards development; Capacitance and resistance standards; coaxial bridges; h igh-frequency (HF) impedance metrology; i nductance–capacitance–resistance (LCR) meters; impedance analyzers (IAs); inductance; quadrifilars; quantum Hall resistance;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2007.891143

Filename

4126826