• DocumentCode
    1229692
  • Title

    NIST Sampling System for Accurate AC Waveform Parameter Measurements

  • Author

    Bergman, David I.

  • Author_Institution
    Quantum Electr. Metrol. Div., National Inst. of Stand. & Technol., Gaithersburg , MD
  • Volume
    56
  • Issue
    2
  • fYear
    2007
  • fDate
    4/1/2007 12:00:00 AM
  • Firstpage
    244
  • Lastpage
    248
  • Abstract
    This paper summarizes efforts at the National Institute of Standards and Technology (NIST) to develop a waveform sampling and digitizing system with accuracy comparable to that of an ac-dc thermal transfer standard for ac voltage measurements over the frequency range of 10 Hz to 1 MHz. In the frequency range from 1 kHz to 1 MHz, the sampler´s gain flatness is better than that available from the best commercial digital multimeter. In ac-ac comparisons referenced to 1 kHz, the system agrees with a NIST-calibrated thermal transfer standard to within 17 muV/V from 20 Hz to 100 kHz for measurements made at both 1 and 0.1 V. The sampler´s excellent dynamic linearity and flat input impedance are also discussed
  • Keywords
    Markov processes; analogue-digital conversion; frequency response; gain measurement; signal sampling; transfer standards; voltage measurement; 0.02 to 100 kHz; 0.1 V; 1 MHz; 1 V; 10 Hz; AC waveform parameter measurements; Markov processes; NIST sampling system; National Institute of Standards and Technology; ac voltage measurements; ac-dc thermal transfer standard; analog-to-digital conversion; digital multimeter; frequency response; gain measurement; measurement standards; signal sampling; waveform digitizing system; waveform sampling; Circuits; Frequency measurement; Frequency synthesizers; Instruments; Linearity; Measurement standards; NIST; Probes; Pulse measurements; Sampling methods; Analog-to-digital conversion (ADC); Markov processes; frequency response; gain measurement; measurement standards; signal sampling;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2007.890589
  • Filename
    4126831