DocumentCode :
1230237
Title :
Phenomenological Model for Frequency-Related Dissipation in the Quantized Hall Resistance
Author :
Jeanneret, Blaise ; Overney, Frédéric
Author_Institution :
Swiss Fed. Office of Metrol. (METAS)
Volume :
56
Issue :
2
fYear :
2007
fDate :
4/1/2007 12:00:00 AM
Firstpage :
431
Lastpage :
434
Abstract :
Recently, ac measurements of the quantized Hall resistance have shown a linear relationship between the deviation of the Hall resistance from the perfectly quantized value DeltaRH and the dissipation in the system represented by the longitudinal resistivity rhoxx ac. In this paper, we present a phenomenological model based on electrodynamic arguments that model this relation. The dissipation is due to the displacement current flowing in the system. All the microscopic features are included in a complex tensorial dielectric susceptibility which remains to be investigated if more physical insight in the ac transport properties of the 2-D electron gas is desired
Keywords :
electric resistance measurement; electrodynamics; optical susceptibility; quantum Hall effect; two-dimensional electron gas; 2D electron gas; ac transport properties; dielectric susceptibility; frequency-related dissipation; phenomenological model; quantized Hall resistance; Conductivity; Current measurement; Dielectric losses; Electrical resistance measurement; Electrons; Frequency measurement; Hall effect; Magnetic field measurement; Metrology; Tensile stress; AC quantum Hall effect (QHE); AC resistance; dielectric losses; dissipation; frequency dependence; metrology;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2007.891162
Filename :
4126881
Link To Document :
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