• DocumentCode
    1230237
  • Title

    Phenomenological Model for Frequency-Related Dissipation in the Quantized Hall Resistance

  • Author

    Jeanneret, Blaise ; Overney, Frédéric

  • Author_Institution
    Swiss Fed. Office of Metrol. (METAS)
  • Volume
    56
  • Issue
    2
  • fYear
    2007
  • fDate
    4/1/2007 12:00:00 AM
  • Firstpage
    431
  • Lastpage
    434
  • Abstract
    Recently, ac measurements of the quantized Hall resistance have shown a linear relationship between the deviation of the Hall resistance from the perfectly quantized value DeltaRH and the dissipation in the system represented by the longitudinal resistivity rhoxx ac. In this paper, we present a phenomenological model based on electrodynamic arguments that model this relation. The dissipation is due to the displacement current flowing in the system. All the microscopic features are included in a complex tensorial dielectric susceptibility which remains to be investigated if more physical insight in the ac transport properties of the 2-D electron gas is desired
  • Keywords
    electric resistance measurement; electrodynamics; optical susceptibility; quantum Hall effect; two-dimensional electron gas; 2D electron gas; ac transport properties; dielectric susceptibility; frequency-related dissipation; phenomenological model; quantized Hall resistance; Conductivity; Current measurement; Dielectric losses; Electrical resistance measurement; Electrons; Frequency measurement; Hall effect; Magnetic field measurement; Metrology; Tensile stress; AC quantum Hall effect (QHE); AC resistance; dielectric losses; dissipation; frequency dependence; metrology;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2007.891162
  • Filename
    4126881