• DocumentCode
    123026
  • Title

    On application of one-class SVM to reverse engineering-based hardware Trojan detection

  • Author

    Chongxi Bao ; Forte, Domenic ; Srivastava, Anurag

  • Author_Institution
    ECE Dept., Univ. of Maryland, College Park, MD, USA
  • fYear
    2014
  • fDate
    3-5 March 2014
  • Firstpage
    47
  • Lastpage
    54
  • Abstract
    Due to design and fabrication outsourcing to foundries, the problem of malicious modifications to integrated circuits known as hardware Trojans has attracted attention in academia as well as industry. To reduce the risks associated with Trojans, researchers have proposed different approaches to detect them. Among these approaches, test-time detection approaches have drawn the greatest attention and most approaches assume the existence of a “golden model”. Prior works suggest using reverse-engineering to identify such Trojan-free ICs for the golden model but they did not state how to do this efficiently. In this paper, we propose an innovative and robust reverseengineering approach to identify the Trojan-free ICs. We adapt a well-studied machine learning method, one-class support vector machine, to solve our problem. Simulation results using state-of-the-art tools on several publicly available circuits show that our approach can detect hardware Trojans with high accuracy rate across different modeling and algorithm parameters.
  • Keywords
    electronic engineering computing; integrated circuit design; invasive software; learning (artificial intelligence); reverse engineering; support vector machines; Trojan-free IC identification; fabrication outsourcing; golden model; integrated circuits; one-class SVM; one-class support vector machine; reverse engineering-based hardware Trojan detection; test-time detection approach; well-studied machine learning method; Feature extraction; Integrated circuit modeling; Layout; Support vector machines; Training; Trojan horses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2014 15th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    978-1-4799-3945-9
  • Type

    conf

  • DOI
    10.1109/ISQED.2014.6783305
  • Filename
    6783305