Title :
High-Sensitivity Optically Modulated Scatterer for Electromagnetic-Field Measurement
Author :
Lao, Ray-Rong ; Liang, Wen-Lie ; Shay, Wen-Tron ; Thompson, Richard P. ; Dudley, Richard A. ; Merckel, Olivier ; Ribière-Tharaud, Nicolas ; Bolomey, Jean-Charles ; Tarng, Jenn-Hwan
fDate :
4/1/2007 12:00:00 AM
Abstract :
The optically modulated-scatterer (OMS) technique is developed for electromagnetic-field-distribution measurement with minimum disturbance to the field under test. In this paper, an OMS with newly designed photoconductive-switching structure is proposed. The performances of the new OMS are evaluated with a monostatic-field-measurement system. Measurement results show that an improvement of 6 to 8 dB in sensitivity is achieved compared to previous OMS devices. The developed OMS was used in an electromagnetic-field-distribution mapping system to measure the field distribution in a cubic phantom radiated by a mobile phone. The results show the suitability of this OMS for specific-absorption-rate measurement application
Keywords :
UHF measurement; electromagnetic fields; electromagnetic wave scattering; photoconducting switches; electromagnetic field distribution measurement; electromagnetic-field measurement; electromagnetic-field-distribution mapping system; monostatic-field-measurement system; optically modulated-scatterer technique; photoconductive-switching structure; specific-absorption-rate measurement; Electromagnetic measurements; Electromagnetic scattering; Imaging phantoms; Mobile handsets; Optical modulation; Optical scattering; Optical sensors; Performance evaluation; Photoconductivity; Testing; Optically modulated scatterer (OMS); radiated field; specific absorption rate (SAR);
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2007.890627
