Title :
Cooper Pair Transport in a Resistor-Biased Josephson Junction Array
Author :
Lotkhov, Sergey V. ; Krupenin, Vladimir A. ; Zorin, Alexander B.
Author_Institution :
Phys.-Technische Bundesanstalt, Braunschweig
fDate :
4/1/2007 12:00:00 AM
Abstract :
The dc transport properties of long arrays of small Al Josephson junctions, biased through on-chip Cr resistors, are studied. The IV characteristics show a large Coulomb threshold for current as well as negative-slope regions indicating the regime of autonomous Bloch oscillations up to rather high frequencies of f = I/2e ~ 1 GHz, comparable to those reported by other groups for single junctions. On the other hand, a small depth of the back-bending implies a low duty cycle and a broad spectrum of the oscillations, which we attribute to the insufficiently high impedance of the bias resistors. A self-sustained switching process at a small bias current is used to study the statistics of the switching voltages and to determine the effective Bloch capacitance which was found to considerably exceed the geometric junction capacitance
Keywords :
Cooper pairs; aluminium; chromium; superconducting arrays; superconducting junction devices; superconducting switches; Al; Al Josephson junctions; Bloch capacitance; Cooper pair transport; Coulomb threshold; Cr; IV characteristics; autonomous Bloch oscillations; dc transport properties; geometric junction capacitance; on-chip Cr resistors; resistor-biased Josephson junction array; self-sustained switching process; Capacitance; Coupling circuits; Equations; Frequency; Josephson junctions; Quantization; Resistors; Superconducting devices; Tunneling; Voltage; Charge transfer; Josephson arrays; S QUIDs; current; stripline components; superconductor–insulator–superconductor devices; thin-film devices;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2007.890793