PRBS generation and error detection above 10 Gb/s using a monolithic Si bipolar IC

Author

Bussmann, Michael ; Langmann, U. ; Hillery, W.J. ; Brown, W.W.

Author_Institution

Mikroelektron.-Zentrum, Ruhr-Univ., Bochum, Germany

Volume

12

Issue

2

fYear

1994

fDate

2/1/1994 12:00:00 AM

Firstpage

353

Lastpage

360

Abstract

This paper describes the application of a monolithic Si bipolar IC to serve as a single-chip measurement instrument for pseudo-random binary sequence (PRBS) generation, bit error detection, de-scrambling, and trigger derivation up to 12.5 Gb/s. The package interconnect problem of high I/O count multi-Gb/s IC´s is addressed. The paper presents a packaging solution with improved ground contact and odd-mode controlled impedance differential microstrip transmission lines. A method for phase synchronization of multiple PRBS generators is proposed and its feasibility is demonstrated by measurement results

Keywords

bipolar integrated circuits; error detection; integrated optoelectronics; optical communication equipment; packaging; silicon; test equipment; 12.5 Gbit/s; PRBS generation; Si; bit error detection; de-scrambling; error detection; high I/O count multi-Gb/s IC´s; improved ground contact; measurement results; monolithic Si bipolar IC; multiple PRBS generators; odd-mode controlled impedance differential microstrip transmission lines; package interconnect problem; packaging solution; phase synchronization; pseudo-random binary sequence generation; single-chip measurement instrument; trigger derivation; Application specific integrated circuits; Binary sequences; Bipolar integrated circuits; Impedance; Instruments; Microstrip; Monolithic integrated circuits; Packaging; Phase measurement; Transmission line measurements;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.350586

Filename

350586